Show simple item record

Characterization of Al/Ti and NiGe ohmic contacts to n-type GeSn CVD-grown layers

dc.contributor.authorFirrincieli, Andrea
dc.contributor.authorGupta, Suyog
dc.contributor.authorVincent, Benjamin
dc.contributor.authorGencarelli, Federica
dc.contributor.authorLin, Dennis
dc.contributor.authorSimoen, Eddy
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorClaeys, Cor
dc.contributor.authorSaraswat, K.
dc.contributor.authorKittl, Jorge
dc.date.accessioned2021-10-20T11:01:00Z
dc.date.available2021-10-20T11:01:00Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20680
dc.sourceIIOimport
dc.titleCharacterization of Al/Ti and NiGe ohmic contacts to n-type GeSn CVD-grown layers
dc.typeMeeting abstract
dc.contributor.imecauthorFirrincieli, Andrea
dc.contributor.imecauthorVincent, Benjamin
dc.contributor.imecauthorLin, Dennis
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpageP4-05
dc.source.conferenceMaterials for Advanced Metallization - MAM
dc.source.conferencedate11/03/2012
dc.source.conferencelocationGrenoble France
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
24641.pdf
Size:
286.6Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record