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BTI reliability of ultra-thin EOT MOSFETs for sub-threshold logic
Publication:
BTI reliability of ultra-thin EOT MOSFETs for sub-threshold logic
Date
2012
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Franco, Jacopo
;
Graziano, Salvatore
;
Kaczer, Ben
;
Crupi, Felice
;
Ragnarsson, Lars-Ake
;
Grasser, Tibor
;
Groeseneken, Guido
Journal
Microelectronics Reliability
Abstract
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1936
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations
Metrics
Views
1936
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations