BTI reliability of ultra-thin EOT MOSFETs for sub-threshold logic

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Authors

Franco, Jacopo; Graziano, Salvatore; Kaczer, Ben; Crupi, Felice; Ragnarsson, Lars-Ake; Grasser, Tibor; Groeseneken, Guido

ISSN

0026-2714

Issue

9_10

Journal

Microelectronics Reliability

Volume

52

Title

BTI reliability of ultra-thin EOT MOSFETs for sub-threshold logic

Publication type

Journal article

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