Publication:
Superior reliability and reduced time-dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applications
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1845 since deposited on 2021-10-20
2last month
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Acq. date: 2026-02-28
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Statistics
Views
1845 since deposited on 2021-10-20
2last month
1last week
Acq. date: 2026-02-28
Citations