Publication:

Impact of single charged gate oxide defects on the performance and scaling of nanoscaled FETs

Date

2012
Proceedings Paper
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Author(s)

Franco, Jacopo  
;
Kaczer, Ben  
;
Toledano Luque, Maria
;
Roussel, Philippe  
;
Mitard, Jerome  
;
Ragnarsson, Lars-Ake  
;
Witters, Liesbeth  
;
Chiarella, Thomas  
;
Togo, Mitsuhiro
;
Horiguchi, Naoto  
;
Groeseneken, Guido  
;
Bukhori, M.F.
;
Grasser, T.
;
Asenov, A.

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