Publication:
Impact of single charged gate oxide defects on the performance and scaling of nanoscaled FETs
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Downloads
1 since deposited on 2021-10-20
Acq. date: 2026-10-05
Views
1922 since deposited on 2021-10-20
3last month
2last week
Acq. date: 2026-10-05
Citations
Statistics
Downloads
1 since deposited on 2021-10-20
Acq. date: 2026-10-05
Views
1922 since deposited on 2021-10-20
3last month
2last week
Acq. date: 2026-10-05
Citations