Authors

Franco, Jacopo; Kaczer, Ben; Toledano Luque, Maria; Roussel, Philippe; Mitard, Jerome; Ragnarsson, Lars-Ake; Witters, Liesbeth; Chiarella, Thomas; Togo, Mitsuhiro; Horiguchi, Naoto; Groeseneken, Guido; Bukhori, M.F.; Grasser, T.; Asenov, A.

Conference

International Reliability Physics Symposium - IRPS

Title

Impact of single charged gate oxide defects on the performance and scaling of nanoscaled FETs

Publication type

Proceedings paper

Embargo date

9999-12-31