Authors

Galeti, M.; Rodrigues, M.; Martino, J.A.; Collaert, Nadine; Simoen, Eddy; Claeys, Cor

ISSN

0038-1101

Issue

1

Journal

Solid-State Electronics

Volume

70

Title

GIDL behavior of p- and n-MuGFET devices with different TiN metal gate thickness and high-k gate dielectrics

Publication type

Journal article

Embargo date

9999-12-31