Publication:
GIDL behavior of p- and n-MuGFET devices with different TiN metal gate thickness and high-k gate dielectrics
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1888 since deposited on 2021-10-20
2last month
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Acq. date: 2026-01-09
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1888 since deposited on 2021-10-20
2last month
1last week
Acq. date: 2026-01-09
Citations