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Recent trends in the electrical characterization and reliability assessment of CMOS devices

dc.contributor.authorGroeseneken, Guido
dc.contributor.authorDegraeve, Robin
dc.contributor.authorCho, Moon Ju
dc.contributor.authorFranco, Jacopo
dc.contributor.authorKaczer, Ben
dc.contributor.authorMartens, Koen
dc.contributor.authorRoussel, Philippe
dc.contributor.authorToledano Luque, Maria
dc.date.accessioned2021-10-20T11:20:05Z
dc.date.available2021-10-20T11:20:05Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20752
dc.sourceIIOimport
dc.titleRecent trends in the electrical characterization and reliability assessment of CMOS devices
dc.typeMeeting abstract
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorMartens, Koen
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecMartens, Koen::0000-0001-7135-5536
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.conference17th Workshop on Dielectrics in Microelectronics - WoDiM
dc.source.conferencedate25/06/2012
dc.source.conferencelocationDresden Germany
imec.availabilityPublished - open access


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