dc.contributor.author | Gronheid, Roel | |
dc.contributor.author | Hendrickx, Eric | |
dc.contributor.author | Hermans, Jan | |
dc.contributor.author | Lorusso, Gian | |
dc.contributor.author | Foubert, Philippe | |
dc.contributor.author | Pollentier, Ivan | |
dc.contributor.author | Goethals, Mieke | |
dc.contributor.author | Jonckheere, Rik | |
dc.contributor.author | Vandenberghe, Geert | |
dc.contributor.author | Ronse, Kurt | |
dc.date.accessioned | 2021-10-20T11:20:38Z | |
dc.date.available | 2021-10-20T11:20:38Z | |
dc.date.issued | 2012 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/20754 | |
dc.source | IIOimport | |
dc.title | Readiness of EUV lithography for insertion into manufacturing: The imec NXE:3100 program | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Gronheid, Roel | |
dc.contributor.imecauthor | Hendrickx, Eric | |
dc.contributor.imecauthor | Hermans, Jan | |
dc.contributor.imecauthor | Lorusso, Gian | |
dc.contributor.imecauthor | Foubert, Philippe | |
dc.contributor.imecauthor | Pollentier, Ivan | |
dc.contributor.imecauthor | Jonckheere, Rik | |
dc.contributor.imecauthor | Vandenberghe, Geert | |
dc.contributor.imecauthor | Ronse, Kurt | |
dc.contributor.orcidimec | Hermans, Jan::0000-0003-1249-8902 | |
dc.contributor.orcidimec | Pollentier, Ivan::0000-0002-4266-6500 | |
dc.contributor.orcidimec | Jonckheere, Rik::0000-0003-2211-9443 | |
dc.contributor.orcidimec | Ronse, Kurt::0000-0003-0803-4267 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.conference | SEMICON Europa | |
dc.source.conferencedate | 9/10/2012 | |
dc.source.conferencelocation | Dresden Germany | |
imec.availability | Published - open access | |