Authors

Halder, Sandip; Miller, Andy; Osman, Haris; Dutta, Barundeb; Mani, Antonio; Jones, Chris; McCance, Syd; Burkeen, Frank

Conference

23rd Annual SEMI Advanced Semiconductor Manufacturing Conference - ASMC

Title

Detection, binning, and analysis of defects in a GaN-on-Si process for high brightness light emitting diodes

Publication type

Proceedings paper

Embargo date

9999-12-31