dc.contributor.author | Halder, Sandip | |
dc.contributor.author | Miller, Andy | |
dc.contributor.author | Osman, Haris | |
dc.contributor.author | Dutta, Barundeb | |
dc.contributor.author | Mani, Antonio | |
dc.contributor.author | Jones, Chris | |
dc.contributor.author | McCance, Syd | |
dc.contributor.author | Burkeen, Frank | |
dc.date.accessioned | 2021-10-20T11:25:51Z | |
dc.date.available | 2021-10-20T11:25:51Z | |
dc.date.issued | 2012 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/20771 | |
dc.source | IIOimport | |
dc.title | Detection, binning, and analysis of defects in a GaN-on-Si process for high brightness light emitting diodes | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Halder, Sandip | |
dc.contributor.imecauthor | Miller, Andy | |
dc.contributor.imecauthor | Osman, Haris | |
dc.contributor.imecauthor | Dutta, Barundeb | |
dc.contributor.imecauthor | Mani, Antonio | |
dc.contributor.orcidimec | Halder, Sandip::0000-0002-6314-2685 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 106 | |
dc.source.endpage | 109 | |
dc.source.conference | 23rd Annual SEMI Advanced Semiconductor Manufacturing Conference - ASMC | |
dc.source.conferencedate | 15/05/2012 | |
dc.source.conferencelocation | Saratoga Springs, NY USA | |
imec.availability | Published - open access | |