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Nanoscale strain characterization using transmission electron microscopy: The software package SIMCON

dc.contributor.authorJanssens, Koenraad
dc.contributor.authorVan Der Biest, O.
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-09-29T12:42:28Z
dc.date.available2021-09-29T12:42:28Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/207
dc.sourceIIOimport
dc.titleNanoscale strain characterization using transmission electron microscopy: The software package SIMCON
dc.typeProceedings paper
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage997
dc.source.endpage998
dc.source.conferenceProceedings of the 13th International Conference on Electron Microscopy - ICEM
dc.source.conferencedate17/07/1994
dc.source.conferencelocationParis France
imec.availabilityPublished - open access
imec.internalnotesVol. 1: Interdisciplinary Developments and Tools


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