Publication:
Optical metrology of thickness and indium content of epitaxial InxGa1-xAs layers on Si substrates
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1864 since deposited on 2021-10-20
1last month
Acq. date: 2025-12-11
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Metrics
Views
1864 since deposited on 2021-10-20
1last month
Acq. date: 2025-12-11
Citations