Recent trends in CMOS reliability: from individual traps to circuit simulations

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Authors
Kaczer, Ben; Toledano Luque, Maria; Franco, Jacopo; Grasser, Tibor; Roussel, Philippe; Camargo, V. V. A.; Mahato, S.; Simoen, Eddy; Catthoor, Francky; Wirth, G. I.; Groeseneken, Guido
Conference
ON Semiconductor
Title
Recent trends in CMOS reliability: from individual traps to circuit simulations
Publication type
Oral presentation
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