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Recent trends in CMOS reliability: from individual traps to circuit simulations

dc.contributor.authorKaczer, Ben
dc.contributor.authorToledano Luque, Maria
dc.contributor.authorFranco, Jacopo
dc.contributor.authorGrasser, Tibor
dc.contributor.authorRoussel, Philippe
dc.contributor.authorCamargo, V. V. A.
dc.contributor.authorMahato, S.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorCatthoor, Francky
dc.contributor.authorWirth, G. I.
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-20T12:00:58Z
dc.date.available2021-10-20T12:00:58Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20890
dc.sourceIIOimport
dc.titleRecent trends in CMOS reliability: from individual traps to circuit simulations
dc.typeOral presentation
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.source.peerreviewno
dc.source.conferenceON Semiconductor
dc.source.conferencedate13/06/2012
dc.source.conferencelocationOudenaarde Belgium
imec.availabilityPublished - imec


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