Authors

Kukner, Halil; Weckx, Pieter; Raghavan, Praveen; Kaczer, Ben; Catthoor, Francky; Van der Perre, Liesbet; Lauwereins, Rudy; Groeseneken, Guido

Conference

15th EUROMICRO Conference on Digital System Design (DSD): Architectures; Methods & Tools

Title

Impact of duty factor, stress stimuli, and gate drive strength on gate delay degradation with an atomistic trap-based BTI model

Publication type

Proceedings paper

Embargo date

9999-12-31