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Workload-dependent BTI reliability evaluation of CMOS logic gates

dc.contributor.authorKukner, Halil
dc.contributor.authorWeckx, Pieter
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorKaczer, Ben
dc.contributor.authorCatthoor, Francky
dc.contributor.authorVan der Perre, Liesbet
dc.contributor.authorLauwereins, Rudy
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-20T12:24:05Z
dc.date.available2021-10-20T12:24:05Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20959
dc.sourceIIOimport
dc.titleWorkload-dependent BTI reliability evaluation of CMOS logic gates
dc.typeOral presentation
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorLauwereins, Rudy
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.contributor.orcidimecLauwereins, Rudy::0000-0002-3861-0168
dc.source.peerreviewno
dc.source.conferenceICT.OPEN 2012- Interface for Dutch ICT-Research
dc.source.conferencedate22/10/2012
dc.source.conferencelocationRotterdam Netherlands
imec.availabilityPublished - imec


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