dc.contributor.author | Li, Yunlong | |
dc.contributor.author | Croes, Kristof | |
dc.contributor.author | Kirimura, Tomoyuki | |
dc.contributor.author | Siew, Yong Kong | |
dc.contributor.author | Tokei, Zsolt | |
dc.date.accessioned | 2021-10-20T12:43:51Z | |
dc.date.available | 2021-10-20T12:43:51Z | |
dc.date.issued | 2012 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/21019 | |
dc.source | IIOimport | |
dc.title | Copper electromigration failure times evaluated over a wide range of voiding phases | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Li, Yunlong | |
dc.contributor.imecauthor | Croes, Kristof | |
dc.contributor.imecauthor | Siew, Yong Kong | |
dc.contributor.imecauthor | Tokei, Zsolt | |
dc.contributor.orcidimec | Li, Yunlong::0000-0003-4791-4013 | |
dc.contributor.orcidimec | Croes, Kristof::0000-0002-3955-0638 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | EM-1 | |
dc.source.conference | IEEE International Reliability Physics Symposium - IRPS | |
dc.source.conferencedate | 15/04/2012 | |
dc.source.conferencelocation | Anaheim, CA USA | |
imec.availability | Published - open access | |