Publication:
Defect analysis in UTBOX SOI nMOSFETs by low-frequency noise
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1983 since deposited on 2021-10-20
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Acq. date: 2025-10-24
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Views
1983 since deposited on 2021-10-20
453item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations