Defect analysis in UTBOX SOI nMOSFETs by low-frequency noise

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Authors
Luque Rodriguez, A.; Cano de Andrade, Gloria; Aoulaiche, Marc; Mendes Almeida, Luciano; Claeys, Cor; Jimenez Tejada, J.A.; Jurczak, Gosia; Simoen, Eddy
Conference
8th European Workshop on Silicon-on-Insulator Technology, Devices and Circuits - EUROSOI
Title
Defect analysis in UTBOX SOI nMOSFETs by low-frequency noise
Publication type
Proceedings paper
Embargo date
9999-12-31
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