Reliability of AlGaN/GaN HEMTs: permanent leakage current increase and output current drop

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Authors

Marcon, Denis; Viaene, John; Favia, Paola; Bender, Hugo; Kang, Xuanwu; Lenci, Silvia; Stoffels, Steve; Decoutere, Stefaan

ISSN

0026-2714

Issue

9_10

Journal

Microelectronics Reliability

Volume

52

Title

Reliability of AlGaN/GaN HEMTs: permanent leakage current increase and output current drop

Publication type

Journal article

Embargo date

9999-12-31

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