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An Advanced Calibration Method for Modelling Oxidation and Mechanical Stress in Sub-Micron CMOS Isolation Structures
Publication:
An Advanced Calibration Method for Modelling Oxidation and Mechanical Stress in Sub-Micron CMOS Isolation Structures
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Date
1994
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Jones, S. K.
;
Poncet, A.
;
De Wolf, Ingrid
;
Ahmed, M.
;
Rothwell, W. J.
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Abstract
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1996
since deposited on 2021-09-29
2
last month
1
last week
Acq. date: 2025-12-11
Citations
Metrics
Views
1996
since deposited on 2021-09-29
2
last month
1
last week
Acq. date: 2025-12-11
Citations