Publication:

PIXE as a complementary technique to RBS in thin film characterization

Date

2012-03
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Author(s)

Meersschaut, Johan  
;
Kayhko, Marko
;
Lenka, Hara
;
Zhao, Qiang
;
Vantomme, Andre  
;
Vandervorst, Wilfried  

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1875 since deposited on 2021-10-20
Acq. date: 2025-12-15

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1875 since deposited on 2021-10-20
Acq. date: 2025-12-15

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