Degradation of AlGaN/GaN HEMTs below the "critical voltage": a time-dependent analysis

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Authors
Meneghini, Matteo; Stocco, Antonio; Bertin, M; Marcon, Denis; Meneghesso, Gaudenzio; Zanoni, Enrico
Conference
International Conference on Compound Semiconductor Manufacturing Technology - CSMantech
Title
Degradation of AlGaN/GaN HEMTs below the "critical voltage": a time-dependent analysis
Publication type
Proceedings paper
Embargo date
9999-12-31
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