dc.contributor.author | Morato, Alessandro | |
dc.contributor.author | Vermang, Bart | |
dc.contributor.author | Goverde, Hans | |
dc.contributor.author | Cornagliotti, Emanuele | |
dc.contributor.author | Meneghesso, Gaudenzio | |
dc.contributor.author | John, Joachim | |
dc.contributor.author | Poortmans, Jef | |
dc.date.accessioned | 2021-10-20T13:39:48Z | |
dc.date.available | 2021-10-20T13:39:48Z | |
dc.date.issued | 2012 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/21167 | |
dc.source | IIOimport | |
dc.title | Electrical characterization of ALD Al2O3 – HfO2 and PECVD Al2O3 passivation layers for p-type CZ-Silicon PERC solar cells | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Vermang, Bart | |
dc.contributor.imecauthor | Cornagliotti, Emanuele | |
dc.contributor.imecauthor | John, Joachim | |
dc.contributor.imecauthor | Poortmans, Jef | |
dc.contributor.orcidimec | Vermang, Bart::0000-0003-2669-2087 | |
dc.contributor.orcidimec | Poortmans, Jef::0000-0003-2077-2545 | |
dc.contributor.orcidimec | John, Joachim::0000-0003-0155-2854 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1077 | |
dc.source.endpage | 1082 | |
dc.source.conference | IEEE Photovoltaic Specialists Conference - PVSC | |
dc.source.conferencedate | 3/06/2012 | |
dc.source.conferencelocation | Austin, TX USA | |
imec.availability | Published - imec | |