Show simple item record

dc.contributor.authorMorato, Alessandro
dc.contributor.authorVermang, Bart
dc.contributor.authorGoverde, Hans
dc.contributor.authorCornagliotti, Emanuele
dc.contributor.authorMeneghesso, Gaudenzio
dc.contributor.authorJohn, Joachim
dc.contributor.authorPoortmans, Jef
dc.date.accessioned2021-10-20T13:39:48Z
dc.date.available2021-10-20T13:39:48Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21167
dc.sourceIIOimport
dc.titleElectrical characterization of ALD Al2O3 – HfO2 and PECVD Al2O3 passivation layers for p-type CZ-Silicon PERC solar cells
dc.typeProceedings paper
dc.contributor.imecauthorVermang, Bart
dc.contributor.imecauthorCornagliotti, Emanuele
dc.contributor.imecauthorJohn, Joachim
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.orcidimecVermang, Bart::0000-0003-2669-2087
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.contributor.orcidimecJohn, Joachim::0000-0003-0155-2854
dc.source.peerreviewyes
dc.source.beginpage1077
dc.source.endpage1082
dc.source.conferenceIEEE Photovoltaic Specialists Conference - PVSC
dc.source.conferencedate3/06/2012
dc.source.conferencelocationAustin, TX USA
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record