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Induced variability of cell-to-cell interference by line edge roughness in nand flash arrays
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Induced variability of cell-to-cell interference by line edge roughness in nand flash arrays
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Date
2012
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Poliakov, Pavel
;
Blomme, Pieter
;
Vaglio Pret, Alessandro
;
Miranda Corbalan, Miguel
;
Gronheid, Roel
;
Verkest, Diederik
;
Van Houdt, Jan
;
Dehaene, Wim
Journal
IEEE Electron Device Letters
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Views
1861
since deposited on 2021-10-20
1
last month
1
last week
Acq. date: 2026-02-25
Citations