Authors

Poliakov, Pavel; Blomme, Pieter; Vaglio Pret, Alessandro; Miranda Corbalan, Miguel; Gronheid, Roel; Verkest, Diederik; Van Houdt, Jan; Dehaene, Wim

ISSN

0026-2714

Issue

3

Journal

Microelectronics Reliability

Volume

52

Title

Trades-off between line edge roughness and error-correcting codes requirements for NAND Flash Memories

Publication type

Journal article