Show simple item record

GIDL behavior in UTBOX SOI devices with high-k/metal gate stacks

dc.contributor.authorRodrigues, M.
dc.contributor.authorGaleti, M.
dc.contributor.authorMartino, J.A.
dc.contributor.authorCollaert, Nadine
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-20T15:22:32Z
dc.date.available2021-10-20T15:22:32Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21411
dc.sourceIIOimport
dc.titleGIDL behavior in UTBOX SOI devices with high-k/metal gate stacks
dc.typeProceedings paper
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage65
dc.source.endpage66
dc.source.conference8th European Workshop on Silicon-on-Insulator Technology, Devices and Circuits - EUROSOI
dc.source.conferencedate24/01/2012
dc.source.conferencelocationMontpellier France
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
24467.pdf
Size:
192.6Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record