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Low-frequency noise assessment of the transport mechanisms in SiGe channel bulk FinFETs

dc.contributor.authorRomeo, Tommaso
dc.contributor.authorPantisano, Luigi
dc.contributor.authorSimoen, Eddy
dc.contributor.authorKrom, Raymond
dc.contributor.authorTogo, Mitsuhiro
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorMitard, Jerome
dc.contributor.authorThean, Aaron
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorClaeys, Cor
dc.contributor.authorCrupi, Felice
dc.date.accessioned2021-10-20T15:27:59Z
dc.date.available2021-10-20T15:27:59Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21422
dc.sourceIIOimport
dc.titleLow-frequency noise assessment of the transport mechanisms in SiGe channel bulk FinFETs
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.imecauthorMitard, Jerome
dc.contributor.imecauthorThean, Aaron
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage330
dc.source.endpage333
dc.source.conference42nd European Solid-State Device Research Conference - ESSDERC
dc.source.conferencedate18/09/2012
dc.source.conferencelocationBordeaux France
imec.availabilityPublished - open access


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