Low-frequency noise assessment of the transport mechanisms in SiGe channel bulk FinFETs

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Authors
Romeo, Tommaso; Pantisano, Luigi; Simoen, Eddy; Krom, Raymond; Togo, Mitsuhiro; Horiguchi, Naoto; Mitard, Jerome; Thean, Aaron; Groeseneken, Guido; Claeys, Cor; Crupi, Felice
Conference
42nd European Solid-State Device Research Conference - ESSDERC
Title
Low-frequency noise assessment of the transport mechanisms in SiGe channel bulk FinFETs
Publication type
Proceedings paper
Embargo date
9999-12-31
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