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Low-frequency noise assessment of the transport mechanisms in SiGe channel bulk FinFETs
Publication:
Low-frequency noise assessment of the transport mechanisms in SiGe channel bulk FinFETs
Date
2012
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Romeo, Tommaso
;
Pantisano, Luigi
;
Simoen, Eddy
;
Krom, Raymond
;
Togo, Mitsuhiro
;
Horiguchi, Naoto
;
Mitard, Jerome
;
Thean, Aaron
;
Groeseneken, Guido
;
Claeys, Cor
;
Crupi, Felice
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Abstract
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1934
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations
Metrics
Views
1934
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations