Publication:

Low-frequency noise assessment of the transport mechanisms in SiGe channel bulk FinFETs

Date

2012
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorRomeo, Tommaso
dc.contributor.authorPantisano, Luigi
dc.contributor.authorSimoen, Eddy
dc.contributor.authorKrom, Raymond
dc.contributor.authorTogo, Mitsuhiro
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorMitard, Jerome
dc.contributor.authorThean, Aaron
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorClaeys, Cor
dc.contributor.authorCrupi, Felice
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.imecauthorMitard, Jerome
dc.contributor.imecauthorThean, Aaron
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.date.accessioned2021-10-20T15:27:59Z
dc.date.available2021-10-20T15:27:59Z
dc.date.embargo9999-12-31
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21422
dc.source.beginpage330
dc.source.conference42nd European Solid-State Device Research Conference - ESSDERC
dc.source.conferencedate18/09/2012
dc.source.conferencelocationBordeaux France
dc.source.endpage333
dc.title

Low-frequency noise assessment of the transport mechanisms in SiGe channel bulk FinFETs

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
24972.pdf
Size:
568.77 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions