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A 65 nm, 850 MHz, 256 kbit, 4.3 pJ/access, ultra low leakage power memory using dynamic cell stability and a dual swing data link
Publication:
A 65 nm, 850 MHz, 256 kbit, 4.3 pJ/access, ultra low leakage power memory using dynamic cell stability and a dual swing data link
Date
2012
Journal article
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25476.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Rooseleer, Bram
;
Cosemans, Stefan
;
Dehaene, Wim
Journal
IEEE Journal of Solid-State Circuits
Abstract
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1952
since deposited on 2021-10-20
Acq. date: 2025-10-27
Citations
Metrics
Views
1952
since deposited on 2021-10-20
Acq. date: 2025-10-27
Citations