Authors

Rooseleer, Bram; Cosemans, Stefan; Dehaene, Wim

ISSN

0018-9200

Issue

7

Journal

IEEE Journal of Solid-State Circuits

Volume

47

Title

A 65 nm, 850 MHz, 256 kbit, 4.3 pJ/access, ultra low leakage power memory using dynamic cell stability and a dual swing data link

Publication type

Journal article

Embargo date

9999-12-31