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Standard cell level parasitics assessment in 20nm BPL and 14nm BFF

dc.contributor.authorSchuddinck, Pieter
dc.contributor.authorBadaroglu, Mustafa
dc.contributor.authorStucchi, Michele
dc.contributor.authorDemuynck, Steven
dc.contributor.authorHikavyy, Andriy
dc.contributor.authorGarcia Bardon, Marie
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorMallik, Arindam
dc.contributor.authorChiarella, Thomas
dc.contributor.authorKubicek, Stefan
dc.contributor.authorAthimulam, Raja
dc.contributor.authorCollaert, Nadine
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorDebusschere, Ingrid
dc.contributor.authorThean, Aaron
dc.contributor.authorAltimime, Laith
dc.contributor.authorVerkest, Diederik
dc.date.accessioned2021-10-20T15:54:16Z
dc.date.available2021-10-20T15:54:16Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21480
dc.sourceIIOimport
dc.titleStandard cell level parasitics assessment in 20nm BPL and 14nm BFF
dc.typeProceedings paper
dc.contributor.imecauthorSchuddinck, Pieter
dc.contributor.imecauthorBadaroglu, Mustafa
dc.contributor.imecauthorStucchi, Michele
dc.contributor.imecauthorDemuynck, Steven
dc.contributor.imecauthorHikavyy, Andriy
dc.contributor.imecauthorGarcia Bardon, Marie
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorMallik, Arindam
dc.contributor.imecauthorChiarella, Thomas
dc.contributor.imecauthorKubicek, Stefan
dc.contributor.imecauthorAthimulam, Raja
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.imecauthorDebusschere, Ingrid
dc.contributor.imecauthorThean, Aaron
dc.contributor.imecauthorVerkest, Diederik
dc.contributor.orcidimecHikavyy, Andriy::0000-0002-8201-075X
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecMallik, Arindam::0000-0002-0742-9366
dc.contributor.orcidimecChiarella, Thomas::0000-0002-6155-9030
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.contributor.orcidimecVerkest, Diederik::0000-0001-6567-2746
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage25.3
dc.source.conferenceInternational Electron Devices Meeting - IEDM
dc.source.conferencedate10/12/2012
dc.source.conferencelocationSan Francisco, CA USA
imec.availabilityPublished - open access


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