Publication:

Empirical model for the low-frequency noise of hot-carrier degraded submicron LDD MOSFET's

Date

Loading...
Thumbnail Image

Journal

Abstract

Description

Metrics

Views

1946 since deposited on 2021-09-30
Acq. date: 2025-10-25

Citations

Metrics

Views

1946 since deposited on 2021-09-30
Acq. date: 2025-10-25

Citations