Empirical model for the low-frequency noise of hot-carrier degraded submicron LDD MOSFET's

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Authors

Simoen, Eddy; Vasina, Petr; Sikula, J.; Claeys, Cor

Issue

10

Journal

IEEE Electron Device Letters

Volume

18

Title

Empirical model for the low-frequency noise of hot-carrier degraded submicron LDD MOSFET's

Publication type

Journal article

Embargo date

9999-12-31

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