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Deep-level transient spectroscopy of MOS capacitors on GeSn epitaxial layers
Publication:
Deep-level transient spectroscopy of MOS capacitors on GeSn epitaxial layers
Date
2012
Meeting abstract
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24803.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Vincent, Benjamin
;
Merckling, Clement
;
Gencarelli, Federica
;
Chu, L-K
;
Loo, Roger
Journal
Abstract
Description
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Metrics
Views
1890
since deposited on 2021-10-20
422
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations