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Study of time-dependent degradation of reverse biased AlGaN/GaN HEMTs

dc.contributor.authorStocco, Antonio
dc.contributor.authorMeneghini, Matteo
dc.contributor.authorBertin,
dc.contributor.authorMarcon, Denis
dc.contributor.authorMeneghesso, Gaudenzio
dc.contributor.authorZanoni, Enrico
dc.date.accessioned2021-10-20T16:31:24Z
dc.date.available2021-10-20T16:31:24Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21559
dc.sourceIIOimport
dc.titleStudy of time-dependent degradation of reverse biased AlGaN/GaN HEMTs
dc.typeMeeting abstract
dc.contributor.imecauthorMarcon, Denis
dc.source.peerreviewyes
dc.source.conferenceWorkshop on Compound Semiconductor Devices and Integrated Circuits - WOCSDICE
dc.source.conferencedate28/05/2012
dc.source.conferencelocationIsland of Porquerolles France
imec.availabilityPublished - imec


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