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GaAs clean up studied with synchrotron radiation photoemission

dc.contributor.authorTallarida, Massimo
dc.contributor.authorAdelmann, Christoph
dc.contributor.authorDelabie, Annelies
dc.contributor.authorVan Elshocht, Sven
dc.contributor.authorCaymax, Matty
dc.contributor.authorSchmeisser, Dieter
dc.date.accessioned2021-10-20T16:43:37Z
dc.date.available2021-10-20T16:43:37Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21584
dc.sourceIIOimport
dc.titleGaAs clean up studied with synchrotron radiation photoemission
dc.typeProceedings paper
dc.contributor.imecauthorAdelmann, Christoph
dc.contributor.imecauthorDelabie, Annelies
dc.contributor.imecauthorVan Elshocht, Sven
dc.contributor.imecauthorCaymax, Matty
dc.contributor.orcidimecAdelmann, Christoph::0000-0002-4831-3159
dc.contributor.orcidimecVan Elshocht, Sven::0000-0002-6512-1909
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage12003
dc.source.conferenceE-MRS Spring Meeting Symposium M: More than Moore: Novel materials approaches for functionalized Silicon based Microelectronics
dc.source.conferencedate14/05/2012
dc.source.conferencelocationStrasbourg France
imec.availabilityPublished - open access
imec.internalnotesIOP Conference Series: Materials Science and Engineering; Vol.41, conference 1


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