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An analytic method to compute the stress dependence on the dimensions and its influence in the characteristics of triple gate devices
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An analytic method to compute the stress dependence on the dimensions and its influence in the characteristics of triple gate devices
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Date
2012
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Trevisoli, R.D.
;
Martino, J.A.
;
Simoen, Eddy
;
Claeys, Cor
;
Pavanello, M.A.
Journal
Microelectronics Reliability
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1879
since deposited on 2021-10-20
Acq. date: 2026-01-11
Citations
Metrics
Views
1879
since deposited on 2021-10-20
Acq. date: 2026-01-11
Citations