Authors

Trevisoli, R.D.; Martino, J.A.; Simoen, Eddy; Claeys, Cor; Pavanello, M.A.

ISSN

0026-2714

Issue

3

Journal

Microelectronics Reliability

Volume

52

Title

An analytic method to compute the stress dependence on the dimensions and its influence in the characteristics of triple gate devices

Publication type

Journal article

Embargo date

9999-12-31