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Forward gate bias on-state stress on AlGaN/GaN MIS-HEMTs for power switching applications
Publication:
Forward gate bias on-state stress on AlGaN/GaN MIS-HEMTs for power switching applications
Date
2012
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wu, Tian-Li
;
Marcon, Denis
;
Zahid, Mohammed
;
Van Hove, Marleen
;
Stoffels, Steve
;
Srivastava, Puneet
;
Decoutere, Stefaan
;
Groeseneken, Guido
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1917
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations
Metrics
Views
1917
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations