Publication:
Electron barrier height at CuxTe1-x/Al2O3 interfaces of conducting bridgememory stacks
Date
Loading...
Journal
Abstract
Description
Metrics
Views
1858 since deposited on 2021-10-21
1last month
Acq. date: 2026-01-09
Citations
Metrics
Views
1858 since deposited on 2021-10-21
1last month
Acq. date: 2026-01-09
Citations