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TiN/STO/TiN MIMcaps nanolayers on silicon characterized by SIMS and AFM
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TiN/STO/TiN MIMcaps nanolayers on silicon characterized by SIMS and AFM
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Date
2013
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Barozzi, Mario
;
Iacob, Erica
;
van den Berg, Jaap A.
;
Reading, Michael A.
;
Adelmann, Christoph
;
Popovici, Mihaela Ioana
;
Tielens, Hilde
;
Bersani, Massimo
Journal
Surface and Interface Analysis
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1902
since deposited on 2021-10-21
Acq. date: 2025-12-12
Citations
Metrics
Views
1902
since deposited on 2021-10-21
Acq. date: 2025-12-12
Citations