Scanning Probe Microscopy as a scalpel to probe filament formation in RRAM devices

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Authors
Celano, Umberto; Goux, Ludovic; Opsomer, Karl; Iapichino, Martina; Franquet, Alexis; Hoflijk, Ilse; Jurczak, Gosia; Vandervorst, Wilfried
Conference
Materials for Advanced Metallization - MAM
Title
Scanning Probe Microscopy as a scalpel to probe filament formation in RRAM devices
Publication type
Meeting abstract
Embargo date
9999-12-31
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