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Investigation of the frequency dispersion effect in the root-model applied to conventional and floating-gate MESFET's
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Investigation of the frequency dispersion effect in the root-model applied to conventional and floating-gate MESFET's
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Date
1997
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2189.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Van Den Bosch, Sven
;
Martens, Luc
Journal
IEEE Trans. Electron Devices
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1945
since deposited on 2021-09-30
Acq. date: 2025-12-12
Citations
Metrics
Views
1945
since deposited on 2021-09-30
Acq. date: 2025-12-12
Citations