Exploring ESD challenges in sub-20-nm bulk FinFET CMOS technology nodes

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Authors
Chen, Shih-Hung; Hellings, Geert; Thijs, Steven; Linten, Dimitri; Scholz, Mirko; Groeseneken, Guido
Conference
35th Annual EOS/ESD Symposium
Title
Exploring ESD challenges in sub-20-nm bulk FinFET CMOS technology nodes
Publication type
Proceedings paper
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