Publication:

Postcycling LRS retention analysis in HfO2/HF RRAM 1T1R device

Date

2013

Journal article

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Files

35778.pdf 695.83 KB

Author(s)

;

Degraeve, Robin

;

Govoreanu, Bogdan

;

;

;

Fantini, Andrea

;

Kar, Gouri Sankar

;

;

Groeseneken, Guido

Journal

IEEE Electron Device Letters

Metrics

1827 since deposited on 2021-10-21

Acq. date: 2026-01-07