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Degradation of deep ultraviolet photoresist by As-implantation studied by Ar-cluster beam profiling
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Degradation of deep ultraviolet photoresist by As-implantation studied by Ar-cluster beam profiling
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Date
2013
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Conard, Thierry
;
Franquet, Alexis
;
Tsvetanova, Diana
;
Mouhib, Tariq
;
Vandervorst, Wilfried
Journal
Surface and Interface Analysis
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1867
since deposited on 2021-10-21
Acq. date: 2025-12-16
Citations
Metrics
Views
1867
since deposited on 2021-10-21
Acq. date: 2025-12-16
Citations