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A Low frequency noise characterization in n-channel UTBOX devices with 6 nm Si film

dc.contributor.authorCretu, Bogdan
dc.contributor.authorSimoen, Eddy
dc.contributor.authorRoutoure, Jean-Marc
dc.contributor.authorCarin, Regis
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-21T07:04:58Z
dc.date.available2021-10-21T07:04:58Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22185
dc.sourceIIOimport
dc.titleA Low frequency noise characterization in n-channel UTBOX devices with 6 nm Si film
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage4
dc.source.conferenceInternational Conference on 1/f Noise and Fluctuations - ICNF
dc.source.conferencedate24/06/2013
dc.source.conferencelocationMontpellier France
imec.availabilityPublished - imec


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