Publication:
A Low frequency noise characterization in n-channel UTBOX devices with 6 nm Si film
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1918 since deposited on 2021-10-21
5last month
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Acq. date: 2026-02-25
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Statistics
Views
1918 since deposited on 2021-10-21
5last month
1last week
Acq. date: 2026-02-25
Citations