A Low frequency noise characterization in n-channel UTBOX devices with 6 nm Si film

Thumbnail
Metadata
Show full item record
Authors
Cretu, Bogdan; Simoen, Eddy; Routoure, Jean-Marc; Carin, Regis; Aoulaiche, Marc; Claeys, Cor
Conference
International Conference on 1/f Noise and Fluctuations - ICNF
Title
A Low frequency noise characterization in n-channel UTBOX devices with 6 nm Si film
Publication type
Proceedings paper
Collections