Publication:

A Low frequency noise characterization in n-channel UTBOX devices with 6 nm Si film

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1910 since deposited on 2021-10-21
Acq. date: 2025-10-23

Citations

Metrics

Views

1910 since deposited on 2021-10-21
Acq. date: 2025-10-23

Citations