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A Low frequency noise characterization in n-channel UTBOX devices with 6 nm Si film
Publication:
A Low frequency noise characterization in n-channel UTBOX devices with 6 nm Si film
Date
2013
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Cretu, Bogdan
;
Simoen, Eddy
;
Routoure, Jean-Marc
;
Carin, Regis
;
Aoulaiche, Marc
;
Claeys, Cor
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1910
since deposited on 2021-10-21
Acq. date: 2025-10-23
Citations
Metrics
Views
1910
since deposited on 2021-10-21
Acq. date: 2025-10-23
Citations