Publication:
A Low frequency noise characterization in n-channel UTBOX devices with 6 nm Si film
Date
| dc.contributor.author | Cretu, Bogdan | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Routoure, Jean-Marc | |
| dc.contributor.author | Carin, Regis | |
| dc.contributor.author | Aoulaiche, Marc | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-21T07:04:58Z | |
| dc.date.available | 2021-10-21T07:04:58Z | |
| dc.date.issued | 2013 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/22185 | |
| dc.source.beginpage | 1 | |
| dc.source.conference | International Conference on 1/f Noise and Fluctuations - ICNF | |
| dc.source.conferencedate | 24/06/2013 | |
| dc.source.conferencelocation | Montpellier France | |
| dc.source.endpage | 4 | |
| dc.title | A Low frequency noise characterization in n-channel UTBOX devices with 6 nm Si film | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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