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Influence of substrate rotation on the low frequency noise of strained triple-gate MuGFETs

dc.contributor.authorde Souza, Marcio
dc.contributor.authorDoria, R.T.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorMartino, Joao
dc.contributor.authorClaeys, Cor
dc.contributor.authorPavanello, Marcello
dc.date.accessioned2021-10-21T07:11:19Z
dc.date.available2021-10-21T07:11:19Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22222
dc.sourceIIOimport
dc.titleInfluence of substrate rotation on the low frequency noise of strained triple-gate MuGFETs
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage2a.3
dc.source.conferenceIEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference
dc.source.conferencedate7/10/2013
dc.source.conferencelocationMonterey, CA USA
imec.availabilityPublished - open access


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