New insights into defect loss, slowdown, and device lifetime enhancement

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Authors

Duan, M.; Zhang, J. F.; Ji, Z.; Zhang, W. D.; Kaczer, Ben; De Gendt, Stefan; Groeseneken, Guido

ISSN

0018-9383

Issue

1

Journal

IEEE Transactions on Electron Devices

Volume

60

Title

New insights into defect loss, slowdown, and device lifetime enhancement

Publication type

Journal article

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